Luis Francisco

College of Engineering

Works (5)

Updated: July 5th, 2023 15:07

2023 journal article

A Deep Transfer Learning Design Rule Checker With Synthetic Training

IEEE DESIGN & TEST, 40(1), 77โ€“84.

By: L. Francisco n, W. Davis n & P. Franzon nโ€‰

co-author countries: United States of America ๐Ÿ‡บ๐Ÿ‡ธ
author keywords: Layout; Design methodology; Convolutional neural networks; Transfer learning; Generators; Deep learning; Manuals; Training data; Design Rule Checking; Machine Learning; IC Verification; Physical Verification; Convolutional Neural Network; Deep Learning; Synthetic Data Training; Transfer Learning
Sources: Web Of Science, ORCID
Added: January 24, 2023

2021 article

Fast and Accurate PPA Modeling with Transfer Learning

2021 ACM/IEEE 3RD WORKSHOP ON MACHINE LEARNING FOR CAD (MLCAD).

By: L. Francisco n, P. Franzon nโ€‰ & W. Davis n

co-author countries: United States of America ๐Ÿ‡บ๐Ÿ‡ธ
author keywords: PPA; Machine Learning; Power; Performance; Area; Gradient Boost; Neural Network; Transfer Learning
Sources: Web Of Science, ORCID
Added: November 15, 2021

2021 conference paper

Fast and Accurate PPA Modeling with Transfer Learning

2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD). Presented at the 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Munich, Germany.

By: W. Davis nโ€‰, P. Franzon nโ€‰, L. Francisco n, B. Huggins n & R. Jain*

co-author countries: United States of America ๐Ÿ‡บ๐Ÿ‡ธ

Event: 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD) at Munich, Germany on November 1-4, 2021

author keywords: PPA; Machine Learning; Power; Performance; Area; Gradient Boost; Neural Network; Transfer Learning; Surrogate Modeling
Sources: Web Of Science, ORCID
Added: February 21, 2022

2020 article

Design Rule Checking with a CNN Based Feature Extractor

PROCEEDINGS OF THE 2020 ACM/IEEE 2ND WORKSHOP ON MACHINE LEARNING FOR CAD (MLCAD '20), pp. 9โ€“14.

By: L. Francisco n, T. Lagare n, A. Jain n, S. Chaudhary n, M. Kulkarni n, D. Sardana n, W. Davis n, P. Franzon nโ€‰

co-author countries: United States of America ๐Ÿ‡บ๐Ÿ‡ธ
author keywords: Design Rule Checking; Machine Learning; IC Verification; Design for Manufacturing; Convolutional Neural Network; Deep Learning
Sources: Web Of Science, ORCID
Added: August 16, 2021

2019 article

Multilayer CMP Hotspot Modeling Through Deep Learning

DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY XIII, Vol. 10962.

By: L. Francisco n, R. Mao*, U. Katakamsetty*, P. Vermaโ€‰* & R. Pack*

co-author countries: Singapore ๐Ÿ‡ธ๐Ÿ‡ฌ United States of America ๐Ÿ‡บ๐Ÿ‡ธ
author keywords: CMP; Machine Learning; DFM; Advanced Lithography; Depth of Focus; CMP hotspots; Chip Topography
Source: Web Of Science
Added: November 11, 2019

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