Mustafa Berke Yelten

Zhu, T., Yelten, M. B., Steer, M. B., & Franzon, P. D. (2013). Variation-Aware Circuit Macromodeling and Design Based on Surrogate Models. SIMULATION AND MODELING METHODOLOGIES, TECHNOLOGIES AND APPLICATIONS, Vol. 197, pp. 255–269. https://doi.org/10.1007/978-3-642-34336-0_17

Yelten, M. B., Franzon, P. D., & Steer, M. B. (2012). Analog Negative-Bias-Temperature-Instability Monitoring Circuit. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 12(1), 177–179. https://doi.org/10.1109/tdmr.2011.2178096

Yelten, M. B., Franzon, P. D., & Steer, M. B. (2012). Comparison of modeling techniques in circuit variability analysis. INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 25(3), 288–302. https://doi.org/10.1002/jnm.836

Yelten, M. B., Franzon, P., & Steer, M. B. (2012). Process mismatch analysis based on reduced-order models. 2012 13th international symposium on quality electronic design (isqed), 648–655. https://doi.org/10.1109/isqed.2012.6187561

Yelten, M. B., & Gard, K. G. (2009). Theoretical analysis and characterization of the tunable matching networks in low noise amplifiers. 2009 European Conference on Circuit Theory and Design, vols 1 and 2, 890–893.

Yelten, M. B., Franzon, P. D., & Steer, M. B. Surrogate-model-based analysis of analog circuits-part I: Variability analysis. IEEE Transactions on Device and Materials Reliability, 11(3), 466–473.

Yelten, M. B., Franzon, P. D., & Steer, M. B. Surrogate-model-based analysis of analog circuits-part II: Reliability analysis. IEEE Transactions on Device and Materials Reliability, 11(3), 458–465.