Matthew John Miller

College of Sciences

Works (1)

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2021 article

Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials

Miller, M. J., Cabral, M. J., Dickey, E. C., LeBeau, J. M., & Reich, B. J. (2021, April 28). TECHNOMETRICS, Vol. 4.

By: M. Miller, M. Cabral, E. Dickey , J. LeBeau & B. Reich 

author keywords: Bayesian hierarchical modeling; Materials science; Scanning transmission electron microscopy; Spatial statistics; Image analysis
Sources: Web Of Science, ORCID
Added: June 28, 2021