Matthew John Miller

College of Sciences

Works (1)

Updated: April 11th, 2023 10:13

2021 article

Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials

Miller, M. J., Cabral, M. J., Dickey, E. C., LeBeau, J. M., & Reich, B. J. (2021, April 28). TECHNOMETRICS, Vol. 4.

By: M. Miller n, M. Cabral n, E. Dickey* , J. LeBeau* & B. Reich n 

Contributors: M. Miller n, M. Cabral n, E. Dickey* , J. LeBeau* & B. Reich n 

author keywords: Bayesian hierarchical modeling; Materials science; Scanning transmission electron microscopy; Spatial statistics; Image analysis
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Added: June 28, 2021

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