@article{varghese_viswan_joshi_seifikar_zhou_schwartz_priya_2014, title={Magnetostriction measurement in thin films using laser Doppler vibrometry}, volume={363}, ISSN={["1873-4766"]}, DOI={10.1016/j.jmmm.2014.03.076}, abstractNote={This paper reports the laser Doppler vibrometry based measurement of the magnetostriction in magnetic thin films. Using this method, the strain induced by an AC magnetic field in the polycrystalline cobalt ferrite and nickel ferrite thin films grown on silicon and platinized silicon substrates was measured under a DC magnetic bias. The experimental setup and the derivation of the magnetostriction constant from the experimentally measured deflection values are discussed. The magnetostriction values derived using force and bending moment balances were compared with that derived from an industry standard relationship. In addition, we corroborate our approach by comparing the values derived from bending theory calculations of magnetically induced torque to those from measurements using Vibrating Sample Magnetometer (VSM). At high DC magnetic field bias, the magnitude of magnetization calculated from the measured magnetostriction was found to match the measured magnetization by VSM.}, journal={JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS}, author={Varghese, Ronnie and Viswan, Ravindranath and Joshi, Keyur and Seifikar, Safoura and Zhou, Yuan and Schwartz, Justin and Priya, Shashank}, year={2014}, month={Aug}, pages={179–187} }
 @article{seifikar_rawdanowicz_straka_quintero_bassiri-gharb_schwartz_2014, title={Structural and magnetic properties of sol-gel derived NiFe2O4 thin films on silicon substrates}, volume={361}, ISSN={["1873-4766"]}, DOI={10.1016/j.jmmm.2014.03.004}, abstractNote={Spinel NiFe2O4 thin films are derived via chemical solution deposition on silicon substrates. The films show a granular microstructure with surface roughness of less than 3 nm. The effects of varying the pyrolysis and annealing conditions on the microstructure and resulting magnetic properties have been studied. Microstructural studies confirm the formation of randomly oriented, phase-pure spinel nickel ferrite for pyrolysis at 100 °C to 500 °C and crystallization at 650 °C to 900 °C for 10 to 30 min. It is shown that the pyrolysis temperature does not affect the microstructure and the resulting magnetic properties, while increasing annealing temperature results in increased grain size and saturation magnetization. Transmission electron microcopy shows that no intermediate or secondary phase has formed at the interface even at annealing temperature as high as 900 °C.}, journal={JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS}, author={Seifikar, Safoura and Rawdanowicz, Thomas and Straka, Weston and Quintero, Christopher and Bassiri-Gharb, Nazanin and Schwartz, Justin}, year={2014}, month={Jun}, pages={255–261} }
 @article{seifikar_calandro_rasic_deeb_yang_bassiri-gharb_schwartz_2013, title={Optimized Growth of Heteroepitaxial (111) NiFe2O4 Thin Films on (0001) Sapphire with Two In-Plane Variants via Chemical Solution Deposition}, volume={96}, ISSN={["1551-2916"]}, DOI={10.1111/jace.12520}, abstractNote={(111)‐oriented epitaxial thin films of nickel ferrite (NFO) are grown on c‐plane sapphire [α‐Al2O3(0001)] substrates using a chemical solution deposition technique. The processing conditions, including pyrolysis and annealing temperatures, are varied to achieve a film that shows maximum texture and epitaxy. It is shown that increasing the pyrolysis temperature to 400°C and decreasing the annealing temperature to 750°C for 10 min result in the highest degree of texture in the films. Lower film thickness also leads to a higher degree of texture. Microstructural studies confirm an in‐plane epitaxial relationship between the (111) NFO film and the (0001) Al2O3 substrate in two variants, [110]NFO ||  or .}, number={10}, journal={JOURNAL OF THE AMERICAN CERAMIC SOCIETY}, author={Seifikar, Safoura and Calandro, Bridget and Rasic, Goran and Deeb, Elisabeth and Yang, Jijin and Bassiri-Gharb, Nazanin and Schwartz, Justin}, year={2013}, month={Oct}, pages={3050–3053} }
 @article{seifikar_tabei_sachet_rawdanowicz_bassiri-gharb_schwartz_2012, title={Growth of (111) oriented NiFe2O4 polycrystalline thin films on Pt(111) via sol-gel processing}, volume={112}, ISSN={["1089-7550"]}, DOI={10.1063/1.4752725}, abstractNote={Polycrystalline NiFe2O4 (NFO) thin films are grown on (111) platinized Si substrates via chemical solution processing. θ-2θ x-ray diffraction, x-ray pole figures and electron diffraction indicate that the NFO has a high degree of 〈111〉 uniaxial texture normal to the film plane. The texturing is initiated by nucleation of (111) planes at the Pt interface and is enhanced with decreasing film thickness. As the NFO magnetic easy-axis is 〈111〉, the out-of-plane magnetization exhibits improved Mr/Ms and coercivity with respect to randomly oriented films on silicon substrates. The out-of-plane Mr/Ms ratio for (111) textured NFO thin film is improved from 30% in 150 nm-thick films to above 70% in 50 nm-thick films. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of comparable thickness deposited by pulsed laser deposition and sputtering.}, number={6}, journal={JOURNAL OF APPLIED PHYSICS}, author={Seifikar, Safoura and Tabei, Ali and Sachet, Edward and Rawdanowicz, Thomas and Bassiri-Gharb, Nazanin and Schwartz, Justin}, year={2012}, month={Sep} }
 @article{seifikar_calandro_deeb_sachet_yang_maria_bassiri-gharb_schwartz_2012, title={Structural and magnetic properties of biaxially textured NiFe2O4 thin films grown on c-plane sapphire}, volume={112}, ISSN={["1089-7550"]}, DOI={10.1063/1.4770366}, abstractNote={Chemical solution deposition is used to grow biaxially textured NiFe2O4 (NFO) thin films on (0001) sapphire substrates; a high degree of out-of-plane orientation in the 〈111〉 direction is confirmed by θ–2θ X-ray diffraction and pole figures. X-ray φ-scanning indicates in-plane texture and an epitaxial relationship between NFO (111) and Al2O3 (0001) in two crystallographic variants. The out-of-plane magnetization exhibits improved Mr/Ms from 0.5 in 110 nm-thick films to 0.8 in 60 nm-thick films. Compared to uniaxially textured NFO films on platinized silicon, the out-of-plane coercivity is reduced by 20%. The improved out-of-plane magnetic anisotropy is comparable to epitaxial NFO films of similar thickness deposited by pulsed laser deposition and sputtering.}, number={12}, journal={JOURNAL OF APPLIED PHYSICS}, author={Seifikar, Safoura and Calandro, Bridget and Deeb, Elisabeth and Sachet, Edward and Yang, Jijin and Maria, Jon-Paul and Bassiri-Gharb, Nazanin and Schwartz, Justin}, year={2012}, month={Dec} }