@article{eldred_abdelhamid_reynolds_el-masry_lebeau_bedair_2020, title={Observing relaxation in device quality InGaN templates by TEM techniques}, volume={116}, ISBN={1077-3118}, DOI={10.1063/1.5139269}, number={10}, journal={APPLIED PHYSICS LETTERS}, author={Eldred, Tim B. and Abdelhamid, Mostafa and Reynolds, J. G. and El-Masry, N. A. and LeBeau, James M. and Bedair, S. M.}, year={2020} }
 @article{dycus_washiyama_eldred_guan_kirste_mita_sitar_collazo_lebeau_2019, title={The role of transient surface morphology on composition control in AlGaN layers and wells}, volume={114}, DOI={10.1063/1.5063933}, number={3}, journal={APPLIED PHYSICS LETTERS}, author={Dycus, J. Houston and Washiyama, Shun and Eldred, Tim B. and Guan, Yan and Kirste, Ronny and Mita, Seiji and Sitar, Zlatko and Collazo, Ramon and LeBeau, James M.}, year={2019} }