@article{jones_broughton_iamsasri_fancher_wilson_reich_smith_2019, title={The use of Bayesian inference in the characterization of materials and thin films}, volume={75}, ISSN={["2053-2733"]}, DOI={10.1107/S0108767319097940}, journal={ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES}, author={Jones, Jacob L. and Broughton, Rachel and Iamsasri, Thanakorn and Fancher, Chris M. and Wilson, Alyson G. and Reich, Brian and Smith, Ralph C.}, year={2019}, pages={A211–A211} }
 @article{iamsasri_guerrier_esteves_fancher_wilson_smith_paisley_johnson-wilke_ihlefeld_bassiri-gharb_et al._2017, title={A Bayesian approach to modeling diffraction profiles and application to ferroelectric materials}, volume={50}, journal={Journal of Applied Crystallography}, author={Iamsasri, T. and Guerrier, J. and Esteves, G. and Fancher, C. M. and Wilson, A. G. and Smith, R. C. and Paisley, E. A. and Johnson-Wilke, R. and Ihlefeld, J. F. and Bassiri-Gharb, N. and et al.}, year={2017}, pages={211–220} }
 @article{iamsasri_esteves_choe_vogt_prasertpalichat_cann_gorfman_jones_2017, title={Time and frequency-dependence of the electric field-induced phase transition in BaTiO3-BiZn1/2Ti1/2O3}, volume={122}, number={6}, journal={Journal of Applied Physics}, author={Iamsasri, T. and Esteves, G. and Choe, H. and Vogt, M. and Prasertpalichat, S. and Cann, D. P. and Gorfman, S. and Jones, J. L.}, year={2017} }
 @article{ochoa_esteves_iamsasri_rubio-marcos_fernandez_garcia_jones_2016, title={Extensive domain wall contribution to strain in a (K,Na)NbO3-based lead-free piezoceramics quantified from high energy X-ray diffraction}, volume={36}, ISSN={["1873-619X"]}, url={http://dx.doi.org/10.1016/j.jeurceramsoc.2016.03.022}, DOI={10.1016/j.jeurceramsoc.2016.03.022}, abstractNote={The origins of high piezoelectric properties in the lead-free (K,Na)NbO3-based tetragonal composition (K0.44Na0.52Li0.04)(Nb0.86Ta0.10Sb0.04)O3 (KNL-NTS) is investigated by quantifying the intrinsic and extrinsic contributions from high energy X-ray diffraction measurements. The applied methodology, which allows discerning between the intrinsic contribution, related to the field induced lattice distortion, and the extrinsic contributions, related to non-180° domain wall motion, is widely described in this work. The non-180° domain reorientation of the KNL-NTS piezoceramic is quantify from the integrated intensities of the 002 and 200 reflections obtained from line profile, while the shifts in peak position versus the applied electric field is used to obtain the lattice strain contribution. Large non-180° domain wall contribution to the electric field induced macroscopic strain (∼80% of the macroscopic strain) is verified in KNL-NTS.}, number={10}, journal={JOURNAL OF THE EUROPEAN CERAMIC SOCIETY}, publisher={Elsevier BV}, author={Ochoa, Diego A. and Esteves, Giovanni and Iamsasri, Thanakorn and Rubio-Marcos, Fernando and Fernandez, Jose F. and Garcia, Jose E. and Jones, Jacob L.}, year={2016}, month={Aug}, pages={2489–2494} }
 @article{usher_iamsasri_forrester_raengthon_triamnak_cann_jones_2016, title={Local and average structures of BaTiO3-Bi(Zn1/2Ti1/2)O-3}, volume={120}, number={18}, journal={Journal of Applied Physics}, author={Usher, T. M. and Iamsasri, T. and Forrester, J. S. and Raengthon, N. and Triamnak, N. and Cann, D. P. and Jones, J. L.}, year={2016} }
 @article{gorfman_simons_iamsasri_prasertpalichat_cann_choe_pietsch_watier_jones_2016, title={Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics}, volume={6}, journal={Scientific Reports}, author={Gorfman, S. and Simons, H. and Iamsasri, T. and Prasertpalichat, S. and Cann, D. P. and Choe, H. and Pietsch, U. and Watier, Y. and Jones, J. L.}, year={2016} }
 @article{iamsasri_tutuncu_uthaisar_wongsaenmai_pojprapai_jones_2015, title={Electric field-induced phase transitions in Li-modified Na0.5K0.5NbO3 at the polymorphic phase boundary}, volume={117}, number={2}, journal={Journal of Applied Physics}, author={Iamsasri, T. and Tutuncu, G. and Uthaisar, C. and Wongsaenmai, S. and Pojprapai, S. and Jones, J. L.}, year={2015} }
 @article{zhao_hou_usher_iamsasri_fancher_forrester_nishida_moghaddam_jones_2015, title={Structure of 3 at.% and 9 at.% Si-doped HfO2 from combined refinement of X-ray and neutron diffraction patterns}, volume={646}, ISSN={["1873-4669"]}, url={http://dx.doi.org/10.1016/j.jallcom.2015.06.084}, DOI={10.1016/j.jallcom.2015.06.084}, abstractNote={The crystal structure of 3 at.% and 9 at.% Si-doped HfO2 powder was determined through refinements using X-ray and neutron diffraction patterns. The lattice parameters, atomic positions, dopant occupancy, and the second phase fraction were determined with high precision using a combined full pattern fitting via the Rietveld method. The results show that both 3 at.% and 9 at.% Si-doped HfO2 powder exhibit the monoclinic crystal structure with P 1 21/c 1 space group. Through the combined refinement, the crystal structure parameters, especially for the positions and occupancies of the lighter atoms, were more precisely determined compared to independent X-ray diffraction refinement. Although the ionic radius of Si4+ is smaller than Hf4+, with increasing Si occupancy, the unit cell volume slightly increases; possible mechanisms for this effect are discussed. Moreover, the refined results provide evidence of the existence of a non-equilibrium phase of HfxSi1−xO2. The second phase (SiO2) fraction is determined as 0.17 at.% for 3 at.% Si-doped HfO2 powders and 1.7 at.% for 9 at.% Si-doped HfO2 powders.}, journal={JOURNAL OF ALLOYS AND COMPOUNDS}, publisher={Elsevier BV}, author={Zhao, Lili and Hou, Dong and Usher, Tedi-Marie and Iamsasri, Thanakorn and Fancher, Chris M. and Forrester, Jennifer S. and Nishida, Toshikazu and Moghaddam, Saeed and Jones, Jacob L.}, year={2015}, month={Oct}, pages={655–661} }
 @article{zhao_nelson_aldridge_iamsasri_fancher_forrester_nishida_moghaddam_jones_2014, title={Crystal structure of Si-doped HfO2}, volume={115}, number={3}, journal={Journal of Applied Physics}, author={Zhao, L. L. and Nelson, M. and Aldridge, H. and Iamsasri, T. and Fancher, C. M. and Forrester, J. S. and Nishida, T. and Moghaddam, S. and Jones, J. L.}, year={2014} }
 @article{carter_aksel_iamsasri_forrester_chen_jones_2014, title={Structure and ferroelectricity of nonstoichiometric (Na0.5Bi0.5)TiO3}, volume={104}, number={11}, journal={Applied Physics Letters}, author={Carter, J. and Aksel, E. and Iamsasri, T. and Forrester, J. S. and Chen, J. and Jones, J. L.}, year={2014} }