Valeriy Sokolov Iafrate, G. J., & Sokolov, V. N. (2021). Bloch-electron dynamics in homogeneous electric fields: Application to multiphoton absorption in semiconductors and insulators. PHYSICAL REVIEW A, 104(6). https://doi.org/10.1103/PhysRevA.104.063113 Iafrate, G., & Sokolov, V. (2020). The Bloch Electron Response to Electric Fields: Application to Graphene. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 257(6). https://doi.org/10.1002/pssb.201900660 Barry, E. A., Sokolov, V. N., Kim, K. W., & Trew, R. J. (2010). Large-Signal Analysis of Terahertz Generation in Submicrometer GaN Diodes. IEEE Sensors Journal, 10(3), 765–771. https://doi.org/10.1109/jsen.2009.2038132 Sokolov, V. N., Kochelap, V. A., & Kim, K. W. (2010). Magnetoconcentration effect in intrinsic graphene ribbons. Applied Physics Letters, 97(11), 112112. https://doi.org/10.1063/1.3486124 Wang, Y., Zou, Y., Araki, T., Luening, J., Kilcoyne, A. L. D., Sokolov, J., … Rafailovich, M. (2010). Probing the Chain and Crystal Lattice Orientation in Polyethylene Thin Films by Near Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy. MACROMOLECULES, 43(19), 8153–8161. https://doi.org/10.1021/ma101213h Kong, B. D., Sokolov, V. N., Kim, K. W., & Trew, R. J. (2010). Quasi-Coherent Thermal Emission in the Terahertz by Doped Semiconductors. IEEE Sensors Journal, 10(3), 443–450. https://doi.org/10.1109/jsen.2009.2038133 Sokolov, V. N., Iafrate, G. J., & Krieger, J. B. (2009). Bloch electron spontaneous emission from a single energy band in a classical ac field. PHYSICAL REVIEW B, 80(16). https://doi.org/10.1103/PhysRevB.80.165328 Barry, E. A., Sokolov, V. N., Kim, K. W., & Trew, R. J. (2009). Terahertz generation in GaN diodes operating in pulsed regime limited by self-heating. Applied Physics Letters, 94(22), 222106. https://doi.org/10.1063/1.3147217 Kong, B. D., Sokolov, V. N., Kim, K. W., & Trew, R. J. (2008). Terahertz emission mediated by surface plasmon polaritons in doped semiconductors with surface grating. Journal of Applied Physics, 103(5), 056101. https://doi.org/10.1063/1.2840063 Barry, E. A., Sokolov, V. N., Kim, K. W., & Trew, R. J. (2008). Terahertz generation in GaN diodes in the limited space-charge accumulation mode. Journal of Applied Physics, 103(12), 126101. https://doi.org/10.1063/1.2946717 Sokolov, V. N., Iafrate, G. J., & Krieger, J. B. (2007). Microcavity enhancement of spontaneous emission for Bloch oscillations. PHYSICAL REVIEW B, 75(4). https://doi.org/10.1103/physrevb.75.045330 Sokolov, V. N., Kim, K. W., Kochelap, V. A., & Muntiian, P. M. (2007). Negative small-signal impedance of nanoscale GaN diodes in the terahertz frequency regime. Applied Physics Letters, 90(14), 142117. https://doi.org/10.1063/1.2720758 Sokolov, V. N., Kong, B. D., Kim, K. W., & Trew, R. J. (2007). Quasimonochromatic emission spectra in the near field by polar semiconductor thermal sources. Applied Physics Letters, 90(11), 113106. https://doi.org/10.1063/1.2713166 Sokolov, V. N., Zhou, L., Iafrate, G. J., & Krieger, J. B. (2006). Spontaneous emission of Bloch oscillation radiation from a single energy band. PHYSICAL REVIEW B, 73(20). https://doi.org/10.1103/physrevb.73.205304 Fedorov, I. A., Sokolov, V. N., Kim, K. W., & Zavada, J. M. (2005). Coulombic effects of electron-hole plasma in nitride-based nanostructures. Journal of Applied Physics, 98(6), 063711. https://doi.org/10.1063/1.2060937 Sokolov, V. N., Kim, K. W., Kochelap, V. A., & Woolard, D. L. (2005). Terahertz generation in submicron GaN diodes within the limited space-charge accumulation regime. Journal of Applied Physics, 98(6), 064507. https://doi.org/10.1063/1.2060956 Sokolov, V. N., Kim, K. W., Kochelap, V. A., & Woolard, D. L. (2004). High-frequency small-signal conductivity of hot electrons in nitride semiconductors. Applied Physics Letters, 84(18), 3630–3632. https://doi.org/10.1063/1.1738518 Sokolov, V. N., Kim, K. W., Kochelap, V. A., & Woolard, D. L. (2004). Phase-plane analysis and classification of transient regimes for high-field electron transport in nitride semiconductors. Journal of Applied Physics, 96(11), 6492–6503. https://doi.org/10.1063/1.1808900