@misc{hsain_lee_materano_mittmann_payne_mikolajick_schroeder_parsons_jones_2022, title={Many routes to ferroelectric HfO2: A review of current deposition methods}, DOI={10.1116/6.0001317}, journal={JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A}, author={Hsain, Hanan Alexandra and Lee, Younghwan and Materano, Monica and Mittmann, Terence and Payne, Alexis and Mikolajick, Thomas and Schroeder, Uwe and Parsons, Gregory N. and Jones, Jacob L.}, year={2022}, month={Jan} }
 @misc{lee_lee_yang_park_kim_reddy_materano_mulaosmanovic_mikolajick_jones_et al._2021, title={Domains and domain dynamics in fluorite-structured ferroelectrics}, DOI={10.1063/5.0047977}, journal={APPLIED PHYSICS REVIEWS}, author={Lee, Dong Hyun and Lee, Younghwan and Yang, Kun and Park, Ju Yong and Kim, Se Hyun and Reddy, Pothala Reddi Sekhar and Materano, Monica and Mulaosmanovic, Halid and Mikolajick, Thomas and Jones, Jacob L. and et al.}, year={2021}, month={Jun} }
 @article{shekhawat_hsain_lee_jones_moghaddam_2021, title={Effect of ferroelectric and interface films on the tunneling electroresistance of the Al2O3/Hf0.5Zr0.5O2 based ferroelectric tunnel junctions}, DOI={10.1088/1361-6528/ac1ebe}, journal={NANOTECHNOLOGY}, author={Shekhawat, Aniruddh and Hsain, H. Alex and Lee, Younghwan and Jones, Jacob L. and Moghaddam, Saeed}, year={2021}, month={Nov} }
 @article{lee_hsain_fields_jaszewski_horgan_edgington_ihlefeld_parsons_jones_2021, title={Unexpectedly large remanent polarization of Hf0.5Zr0.5O2 metal-ferroelectric-metal capacitor fabricated without breaking vacuum}, volume={118}, ISBN={1077-3118}, DOI={10.1063/5.0029532}, number={1}, journal={APPLIED PHYSICS LETTERS}, author={Lee, Younghwan and Hsain, H. Alex and Fields, Shelby S. and Jaszewski, Samantha T. and Horgan, Madison D. and Edgington, Patrick G. and Ihlefeld, Jon F. and Parsons, Gregory N. and Jones, Jacob L.}, year={2021} }
 @article{park_yang_lee_kim_lee_reddy_jones_park_2020, title={A perspective on semiconductor devices based on fluorite-structured ferroelectrics from the materials-device integration perspective}, volume={128}, ISBN={1089-7550}, DOI={10.1063/5.0035542}, number={24}, journal={JOURNAL OF APPLIED PHYSICS}, author={Park, Ju Yong and Yang, Kun and Lee, Dong Hyun and Kim, Se Hyun and Lee, Younghwan and Reddy, P. R. Sekhar and Jones, Jacob L. and Park, Min Hyuk}, year={2020} }
 @article{hsain_lee_parsons_jones_2020, title={Compositional dependence of crystallization temperatures and phase evolution in hafnia-zirconia (HfxZr1-x)O-2 thin films}, volume={116}, ISBN={1077-3118}, DOI={10.1063/5.0002835}, number={19}, journal={APPLIED PHYSICS LETTERS}, author={Hsain, H. Alex and Lee, Younghwan and Parsons, Gregory and Jones, Jacob L.}, year={2020} }
 @article{strader_lee_teska_li_jones_2019, title={Approaches for Characterizing Surfaces Damaged by Disinfection in Healthcare}, volume={9}, ISBN={1793-9852}, DOI={10.1142/S1793984419500028}, number={4}, journal={NANO LIFE}, author={Strader, Phillip and Lee, Younghwan and Teska, Peter and Li, Xiaobao and Jones, Jacob L.}, year={2019}, month={Dec} }