H. Kirk

Works (2)

Updated: July 5th, 2023 16:02

2000 journal article

Electron beam induced current contrast of oxygen precipitation related defects in Czochralski silicon

Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 78-79(2000), 237–252.

By: T. Ono, T. Sasaki, H. Kirk & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1999 article

Bias Dependent Contrast Mechanisms in EBIC Images of MOS Capacitors

Kirk, H. R., Radzimski, Z., Romanowski, A., & Rozgonyi, G. A. (1999, April 1). Journal of The Electrochemical Society.

By: H. Kirk n, Z. Radzimski*, A. Romanowski n & G. Rozgonyi n

topics (OpenAlex): Semiconductor materials and devices; Anodic Oxide Films and Nanostructures; Electron and X-Ray Spectroscopy Techniques
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Source: Web Of Science
Added: August 6, 2018

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