2000 journal article

Electron beam induced current contrast of oxygen precipitation related defects in Czochralski silicon

Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 78-79(2000), 237–252.

By: T. Ono, T. Sasaki, H. Kirk & G. Rozgonyi

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Bias dependent contrast mechanisms in EBIC images of MOS capacitors

Journal of the Electrochemical Society, 146(4), 1529–1535.

Source: NC State University Libraries
Added: August 6, 2018