Works (2)
Updated: July 5th, 2023 16:02
2000 journal article
Electron beam induced current contrast of oxygen precipitation related defects in Czochralski silicon
Diffusion and Defect Data. [Pt. B], Solid State Phenomena, 78-79(2000), 237–252.
Source: NC State University Libraries
Added: August 6, 2018
1999 journal article
Bias dependent contrast mechanisms in EBIC images of MOS capacitors
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 146(4), 1529–1535.
UN Sustainable Development Goal Categories
7. Affordable and Clean Energy
(Web of Science)
Source: Web Of Science
Added: August 6, 2018
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