2014 journal article
Epitaxial growth of three-dimensionally mesostructured single-crystalline Cu2O via templ-ated electrodeposition
Chemistry of Materials, 26(24), 7051–7058.
2014 journal article
The five parameter grain boundary character distribution of polycrystalline silicon
Journal of Materials Science, 49(14), 4938–4945.
2012 journal article
Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon
Applied Physics Letters, 101(22).
2012 journal article
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon
Journal of Applied Physics, 111(3).
2012 article
Effect of nickel contamination on high carrier lifetime n-type crystalline silicon (vol 111, 033702, 2012)
Journal of Applied Physics, Vol. 111.
2012 journal article
Oxygen precipitation related stress-modified crack propagation in high growth rate Czochralski silicon wafers
Journal of the Electrochemical Society, 159(2), H125–129.
2010 journal article
Microstructure and electrical properties of high power laser thermal annealing on inkjet-printed Ag films
Microelectronic Engineering, 87(11), 2230–2233.
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