Phillip E. Russell

Focused ion beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications

Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. (2008, November 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Scanning cathodoluminescence microscopy

Advances in Imaging and Electron Physics, Vol 147, 147, 1–135.

On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data

Applied Physics Letters, 89(19).

Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN∕GaN quantum-well light-emitting diode

Bunker, K. L., Garcia, R., & Russell, P. E. (2005, February 18). Applied Physics Letters, Vol. 86.

Circuit editing of copper and low‐k dielectrics in nanotechnology devices

MOSSELVELD, F., MAKAROV, V. V., LUNDQUIST, T. R., GRIFFIS, D. P., & RUSSELL, P. E. (2004, May 21). Journal of Microscopy.

High efficiency GaN-based LEDs and lasers on SiC

Journal of Crystal Growth, 272(04-Jan), 242–250.

Chemically enhanced focused ion beam micro-machining of copper

Washington, DC: U.S. Patent and Trademark Office.

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning, 25(1), 45–51.

Cross-sectional Scanning Probe Microscopy of GaN-based p–n heterostructures

Silva, M. I. N., González, J. C., & Russell, P. E. (2003, April 23). Microelectronics Journal.

Electrical characterization of InGaN quantum well p–n heterostructures

González, J. C., Silva, M. I. N., Bunker, K. L., Batchelor, A. D., & Russell, P. E. (2003, April 23). Microelectronics Journal.

Etching characteristics of chromium thin films by an electron beam induced surface reaction

Wang, J., Griffis, D. P., Garcia, R., & Russell, P. E. (2003, February 10). Semiconductor Science and Technology.

Improvements in focused ion beam micromachining of interconnect materials

Gonzalez, J. C., Silva, M. I. N., Griffis, D. P., & Russell, P. E. (2002, November 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Multiscale Dewetting of Low-Molecular-Weight Block Copolymer Ultrathin Films

Leonard, D. N., Russell, P. E., Smith, S. D., & Spontak, R. J. (2002, February 1). Macromolecular Rapid Communications, Vol. 23, pp. 205–209.

Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM

Leonard, D. N., Spontak, R. J., Smith, S. D., & Russell, P. E. (2002, January 1). Polymer, Vol. 43, pp. 6719–6726.

Chemically enhanced focused ion beam micromachining of copper

Gonzalez, J. C., Griffis, D. P., Miau, T. T., & Russell, P. E. (2001, November 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Minority-carrier diffusion length in a GaN-based light-emitting diode

Gonzalez, J. C., Bunker, K. L., & Russell, P. E. (2001, September 3). Applied Physics Letters.

Self-healing on OPA self-assembled monolayers

Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, August 23). Nanotechnology.

Spread Coating of OPA on Mica:  From Multilayers to Self-Assembled Monolayers

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2001, November 28). Langmuir.

Channeling effects during focused-ion-beam micromachining of copper

Phillips, J. R., Griffis, D. P., & Russell, P. E. (2000, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Defect-dependent Elasticity: Nanoindentation as a Probe of Stress State

Jarausch, K. F., Kiely, J. D., Houston, J. E., & Russell, P. E. (2000, August 1). Journal of Materials Research/Pratt's Guide to Venture Capital Sources.

Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 389–390). Bristol: Institute of Physics Publishing.

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

Thermal stability study of self-assembled monolayers on mica

Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999, November 1). Microscopy and Microanalysis.

Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies

Neves, B. R. A., Vilela, J. M. C., Russell, P. E., Reis, A. C. C., & Andrade, M. S. (1999, February 1). Ultramicroscopy.

Initial stages of yield in nanoindentation

Kiely, J. D., Jarausch, K. F., Houston, J. E., & Russell, P. E. (1999, June 1). Journal of Materials Research/Pratt's Guide to Venture Capital Sources.

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

Observation of topography inversion in atomic force microscopy of self-assembled monolayers

Neves, B. R. A., Leonard, D. N., Salmon, M. E., Russell, P. E., & Troughton, E. B. (1999, December 1). Nanotechnology.

Chemically and geometrically enhanced focused ion beam micromachining

Russell, P. E., Stark, T. J., Griffis, D. P., Phillips, J. R., & Jarausch, K. F. (1998, July 1). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Method of fabricating scanning tunneling microscope tips

Washington, DC: U.S. Patent and Trademark Office.

Scanning tunneling microscope tips

Washington, DC: U.S. Patent and Trademark Office.