Works (32)

Updated: July 5th, 2023 16:03

2008 article

Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications

Dhawan, A., Muth, J. F., Leonard, D. N., Gerhold, M. D., Gleeson, J., Vo-Dinh, T., & Russell, P. E. (2008, November). JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 26, pp. 2168–2173.

co-author countries: United States of America 🇺🇸
author keywords: chemical sensors; fibre optic sensors; focused ion beam technology; gold; metallic thin films; nanostructured materials; refractive index; silver; surface plasmon resonance
Source: Web Of Science
Added: August 6, 2018

2007 journal article

Scanning cathodoluminescence microscopy

Advances in Imaging and Electron Physics, Vol 147, 147, 1–135.

By: C. Parish & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data

Applied Physics Letters, 89(19).

By: C. Parish & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN/GaN quantum-well light-emitting diode

APPLIED PHYSICS LETTERS, 86(8).

By: K. Bunker n, R. Garcia n & P. Russell n

co-author countries: United States of America 🇺🇸
Sources: Web Of Science, ORCID
Added: August 6, 2018

2004 article

Circuit editing of copper and low-k dielectrics in nanotechnology devices

Mosselveld, F., Makarov, VV, Lundquist, T. R., Griffis, D. P., & Russell, P. E. (2004, June). JOURNAL OF MICROSCOPY, Vol. 214, pp. 246–251.

By: F. Mosselveld, . Makarov, T. Lundquist, D. Griffis n & P. Russell n

co-author countries: United States of America 🇺🇸
author keywords: copper etching; device modification; low-k dielectrics
Source: Web Of Science
Added: August 6, 2018

2004 journal article

High efficiency GaN-based LEDs and lasers on SiC

Journal of Crystal Growth, 272(04-Jan), 242–250.

By: J. Edmond, A. Abare, M. Bergman, J. Bharathan, K. Bunker, D. Emerson, K. Haberern, J. Ibbetson ...

Source: NC State University Libraries
Added: August 6, 2018

2003 patent

Chemically enhanced focused ion beam micro-machining of copper

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis & J. Gonzales Perez

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning, 25(1), 45–51.

By: J. Bender, M. Salmon & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

2003 article

Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures

MICROELECTRONICS JOURNAL, Vol. 34, pp. 571–573.

By: M. Silva*, J. Gonzalez* & P. Russell n

co-author countries: Brazil 🇧🇷 United States of America 🇺🇸
author keywords: GaN-based p-n heterostructure; Scanning Probe Microscopy; Electric Force Gradient Microscopy
Source: Web Of Science
Added: August 6, 2018

2003 article

Electrical characterization of InGaN quantum well p-n heterostructures

MICROELECTRONICS JOURNAL, Vol. 34, pp. 455–457.

By: J. Gonzalez*, M. Silva*, K. Bunker n, A. Batchelor n & P. Russell n

co-author countries: Brazil 🇧🇷 United States of America 🇺🇸
author keywords: InGaN; electrical force microscopy; p-n heterostructure
Source: Web Of Science
Added: August 6, 2018

2003 journal article

Etching characteristics of chromium thin films by an electron beam induced surface reaction

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 18(4), 199–205.

By: J. Wang*, D. Griffis n, R. Garcia n & P. Russell n

co-author countries: China 🇨🇳 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 article

Improvements in focused ion beam micromachining of interconnect materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 20, pp. 2700–2704.

By: J. Gonzalez n, M. Silva n, D. Griffis n & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2002 journal article

Multiscale dewetting of low-molecular-weight block copolymer ultrathin films

MACROMOLECULAR RAPID COMMUNICATIONS, 23(3), 205–209.

By: D. Leonard n, P. Russell n, S. Smith* & R. Spontak*

co-author countries: United States of America 🇺🇸
author keywords: block copolymers; surface dewetting; surface patterns; thin films
Sources: Web Of Science, ORCID
Added: August 6, 2018

2002 journal article

Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM

POLYMER, 43(25), 6719–6726.

By: D. Leonard n, R. Spontak n, S. Smith* & P. Russell n

co-author countries: United States of America 🇺🇸
author keywords: block copolymer; polymer dewetting; order-disorder transition
Sources: Web Of Science, ORCID
Added: August 6, 2018

2001 article

Chemically enhanced focused ion beam micromachining of copper

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 19, pp. 2539–2542.

By: J. Gonzalez n, D. Griffis n, T. Miau* & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Minority-carrier diffusion length in a GaN-based light-emitting diode

APPLIED PHYSICS LETTERS, 79(10), 1567–1569.

By: J. Gonzalez n, K. Bunker n & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 article

Self-healing on OPA self-assembled monolayers

Neves, B. R. A., Salmon, M. E., Troughton, E. B., & Russell, P. E. (2001, September). NANOTECHNOLOGY, Vol. 12, pp. 285–289.

By: B. Neves n, M. Salmon n, E. Troughton* & P. Russell n

co-author countries: Brazil 🇧🇷 United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2001 journal article

Spread coating of OPA on mica: From multilayers to self-assembled monolayers

LANGMUIR, 17(26), 8193–8198.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 article

Channeling effects during focused-ion-beam micromachining of copper

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1061–1065.

By: . Phillips n, D. Griffis n & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 journal article

Defect-dependent elasticity: Nanoindentation as a probe of stress state

JOURNAL OF MATERIALS RESEARCH, 15(8), 1693–1701.

By: K. Jarausch n, J. Kiely*, J. Houston* & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

2000 chapter

Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 389–390). Bristol: Institute of Physics Publishing.

By: D. Leonard, R. Spontak & P. Russell

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

2000 chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In D. B. Williams & R. Shimizu (Eds.), Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Ed(s): D. Williams & R. Shimizu

Source: NC State University Libraries
Added: August 6, 2018

2000 personal communication

Thermal stability study of self-assembled monolayers on mica

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate

MICROSCOPY AND MICROANALYSIS, 5(6), 413–419.

By: B. Neves n, M. Salmon n, P. Russell n & E. Troughton*

co-author countries: United States of America 🇺🇸
author keywords: field emission-scanning electron microscopy; atomic force microscopy; scanning probe microscopy; self-assembled monolayers; octadecylphosphonic acid
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies

ULTRAMICROSCOPY, 76(1-2), 61–67.

By: B. Neves*, J. Vilela*, P. Russell n, A. Reis* & M. Andrade*

co-author countries: Brazil 🇧🇷 United States of America 🇺🇸
author keywords: scanning tunneling microscopy; atomic force microscopy; intermittent contact mode; contact mode; Au film; micro-cracks
Source: Web Of Science
Added: August 6, 2018

1999 journal article

Initial stages of yield in nanoindentation

JOURNAL OF MATERIALS RESEARCH, 14(6), 2219–2227.

By: J. Kiely*, K. Jarausch n, J. Houston* & P. Russell n

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1999 patent

Method for water vapor enhanced charged-particle-beam machining

Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Observation of topography inversion in atomic force microscopy of self-assembled monolayers

NANOTECHNOLOGY, 10(4), 399–404.

By: B. Neves n, D. Leonard n, M. Salmon n, P. Russell n & E. Troughton*

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1998 article

Chemically and geometrically enhanced focused ion beam micromachining

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Vol. 16, pp. 2494–2498.

By: P. Russell n, T. Stark, D. Griffis, . Phillips & K. Jarausch

co-author countries: United States of America 🇺🇸
Source: Web Of Science
Added: August 6, 2018

1992 patent

Method of fabricating scanning tunneling microscope tips

Washington, DC: U.S. Patent and Trademark Office.

By: I. Musselman & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

1992 patent

Scanning tunneling microscope tips

Washington, DC: U.S. Patent and Trademark Office.

By: I. Musselman & P. Russell

Source: NC State University Libraries
Added: August 6, 2018

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