Works (33)

2008 | conference paper

Focused in beam fabrication of metallic nanostructures on end faces of optical fibers for chemical sensing applications

In Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures (Vol. 26, pp. 2168–2173).

By: A. Dhawan, J. Muth, D. Leonard, M. Gerhold, J. Gleeson, T. Vo-Dinh, P. Russell

Source: NC State University Libraries

2007 | journal article

Scanning cathodoluminescence microscopy

Advances in Imaging and Electron Physics, Vol 147, 147, 1–135.

By: C. Parish & P. Russell

Source: NC State University Libraries

2006 | journal article

On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data

Applied Physics Letters, 89(19).

By: C. Parish & P. Russell

Source: NC State University Libraries

2005 | journal article

Scanning electron microscopy cathodoluminescence studies of piezoelectric fields in an InGaN/GaN quantum-well light-emitting diode

Applied Physics Letters, 86(8).

By: K. Bunker, R. Garcia & P. Russell

Source: NC State University Libraries

2004 | journal article

Circuit editing of copper and low-k dielectrics in nanotechnology devices

Journal of Microscopy, 214(2004 Jun), 246–251.

By: F. Mosselveld, V. Makarov, T. Lundquist, D. Griffis & P. Russell

Source: NC State University Libraries

2004 | journal article

High efficiency GaN-based LEDs and lasers on SiC

Journal of Crystal Growth, 272(04-Jan), 242–250.

By: J. Edmond, A. Abare, M. Bergman, J. Bharathan, K. Bunker, D. Emerson, K. Haberern, J. Ibbetson ...

Source: NC State University Libraries

2003 | patent

Chemically enhanced focused ion beam micro-machining of copper

Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003, November 11). Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis & J. Gonzales Perez

Source: NC State University Libraries

2003 | patent

Chemically enhanced focused ion beam micro-machining of copper

Russell, P. E., Griffis, D. P., & Gonzales Perez, J. C. (2003, February 4). Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis & J. Gonzales Perez

Source: NC State University Libraries

2003 | journal article

Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes

Scanning, 25(1), 45–51.

By: J. Bender, M. Salmon & P. Russell

Source: NC State University Libraries

2003 | journal article

Cross-sectional Scanning Probe Microscopy of GaN-based p-n heterostructures

Microelectronics Journal, 34(5-8), 571–573.

By: M. Da Silva, J. Gonzalez & P. Russell

Source: NC State University Libraries

2003 | journal article

Electrical characterization of InGaN quantum well p-n heterostructures

Microelectronics Journal, 34(5-8), 455–457.

By: J. Gonzalez, M. Da Silva, K. Bunker, A. Batchelor & P. Russell

Source: NC State University Libraries

2003 | journal article

Etching characteristics of chromium thin films by an electron beam induced surface reaction

Semiconductor Science and Technology, 18(4), 199–205.

By: J. Wang, D. Griffis, R. Garcia & P. Russell

Source: NC State University Libraries

2002 | journal article

Improvements in focused ion beam micromachining of interconnect materials

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(6), 2700–2704.

By: J. Gonzalez, M. Da Silva, D. Griffis & P. Russell

Source: NC State University Libraries

2002 | journal article

Multiscale dewetting of low-molecular-weight block copolymer ultrathin films

Macromolecular Rapid Communications, 23(3), 205–209.

By: D. Leonard, P. Russell, S. Smith & R. Spontak

Sources: NC State University Libraries, ORCID

2002 | journal article

Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM

Polymer, 43(25), 6719–6726.

By: D. Leonard, R. Spontak, S. Smith & P. Russell

Sources: NC State University Libraries, ORCID

2001 | journal article

Chemically enhanced focused ion beam micromachining of copper

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 19(6), 2539–2542.

By: J. Gonzalez, D. Griffis, T. Miau & P. Russell

Source: NC State University Libraries

2001 | journal article

Minority-carrier diffusion length in a GaN-based light-emitting diode

Applied Physics Letters, 79(10), 1567–1569.

By: J. Gonzalez, K. Bunker & P. Russell

Source: NC State University Libraries

2001 | journal article

Self-healing on OPA self-assembled monolayers

Nanotechnology, 12(3), 285–289.

By: B. Neves, M. Salmon, E. Troughton & P. Russell

Source: NC State University Libraries

2001 | journal article

Spread coating of OPA on mica: From multilayers to self- assembled monolayers

Langmuir, 17(26), 8193–8198.

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries

2000 | journal article

Channeling effects during focused-ion-beam micromachining of copper

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1061–1065.

By: J. Phillips, D. Griffis & P. Russell

Source: NC State University Libraries

2000 | journal article

Defect-dependent elasticity: Nanoindentation as a probe of stress state

Journal of Materials Research, 15(8), 1693–1701.

By: K. Jarausch, J. Kiely, J. Houston & P. Russell

Source: NC State University Libraries

2000 | chapter

Environmental atomic force microscopy: Probing diblock polymer thin films and self-assembling molecules at various temperatures and pressures

In Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 389–390). Bristol: Institute of Physics Publishing.

By: D. Leonard, R. Spontak & P. Russell

Source: NC State University Libraries

2000 | patent

Method for water vapor enhanced charged-particle-beam machining

Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (2000, October 31). Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries

2000 | chapter

Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy

In Microbeam Analysis 2000: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 (Vol. 165, pp. 367–368). Bristol: Institute of Physics Publishing.

By: B. Neves, M. Salmon, D. Leonard, E. Troughton & P. Russell

Source: NC State University Libraries

2000 | personal communication

Thermal stability study of self-assembled monolayers on mica

Neves, B. R. A., Salmon, M. E., Russell, P. E., & Troughton, E. B. (2000, March 21). Langmuir.

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries

1999 | journal article

Comparative study of field emission-scanning electron microscopy and atomic force microscopy to assess self-assembled monolayer coverage on any type of substrate

Microscopy and Microanalysis, 5(6), 413–419.

By: B. Neves, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries

1999 | journal article

Imaging micro-cracks in gold films: a comparative study of scanning tunneling and atomic force microscopies

Ultramicroscopy, 76(1-2), 61–67.

By: B. Neves, J. Vilela, P. Russell, A. Reis & M. Andrade

Source: NC State University Libraries

1999 | journal article

Initial stages of yield in nanoindentation

Journal of Materials Research, 14(6), 2219–2227.

By: J. Kiely, K. Jarausch, J. Houston & P. Russell

Source: NC State University Libraries

1999 | patent

Method for water vapor enhanced charged-particle-beam machining

Russell, P. E., Griffis, D. P., Shedd, G. M., Stark, T. J., & Vitarelli, J. (1999, September 28). Washington, DC: U.S. Patent and Trademark Office.

By: P. Russell, D. Griffis, G. Shedd, T. Stark & J. Vitarelli

Source: NC State University Libraries

1999 | journal article

Observation of topography inversion in atomic force microscopy of self-assembled monolayers

Nanotechnology, 10(4), 399–404.

By: B. Neves, D. Leonard, M. Salmon, P. Russell & E. Troughton

Source: NC State University Libraries

1998 | journal article

Chemically and geometrically enhanced focused ion beam micromachining

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 16(4), 2494–2498.

By: P. Russell, T. Stark, D. Griffis, J. Phillips & K. Jarausch

Source: NC State University Libraries

1992 | patent

Method of fabricating scanning tunneling microscope tips

Musselman, I. H., & Russell, P. E. (1992, April 2). Washington, DC: U.S. Patent and Trademark Office.

By: I. Musselman & P. Russell

Source: NC State University Libraries

1992 | patent

Scanning tunneling microscope tips

Washington, DC: U.S. Patent and Trademark Office.

By: I. Musselman & P. Russell

Source: NC State University Libraries