Nikolaus Dietz

Optical properties of InN grown on templates with controlled surface polarities

Kirste, R., Wagner, M. R., Schulze, J. H., Strittmatter, A., Collazo, R., Sitar, Z., … Hoffmann, A. (2010, July 9). Physica Status Solidi (a), Vol. 207, pp. 2351–2354.

Antiphase boundaries in GaP layers grown on (001) Si by chemical beam epitaxy

Narayanan, V., Mahajan, S., Bachmann, K. J., Woods, V., & Dietz, N. (2002, April 1). Acta Materialia.

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Blickle, V., Flock, K., Dietz, N., & Aspnes, D. E. (2002, July 22). Applied Physics Letters, Vol. 81, pp. 628–630.

Stacking faults and twins in gallium phosphide layers grown on silicon

Narayanan, V., Mahajan, S., Bachmann, K. J., Woods, V., & Dietz, N. (2002, March 1). Philosophical Magazine. A/Philosophical Magazine. A. Physics of Condensed Matter. Structure, Defects and Mechanical Properties.

Surface reaction kinetics of Ga1−xInxP growth during pulsed chemical beam epitaxy

Dietz, N., Beeler, S. C., Schmidt, J. W., & Tran, H. T. (2001, July 1). Applied Surface Science, Vol. 178, pp. 63–74.

Theoretical analysis of phase-matched second-harmonic generation and optical parametric oscillation in birefringent semiconductor waveguides

Dimmock, J. O., Madarasz, F. L., Dietz, N., & Bachmann, K. J. (2001, March 20). Applied Optics.

Erratum: “Sellmeier parameters for ZnGaP2 and GaP” [J. Appl. Phys. 87, 1564 (2000)]

Madarasz, F. L., Dimmock, J. O., Dietz, N., & Bachmann, K. J. (2000, May 15). Journal of Applied Physics.

Orientation mediated self-assembled gallium phosphide islands grown on silicon

Narayanan, V., Mahajan, S., Sukidi, N., Bachmann, K. J., Woods, V., & Dietz, N. (2000, March 1). Philosophical Magazine. A/Philosophical Magazine. A. Physics of Condensed Matter. Structure, Defects and Mechanical Properties.

Real-time thickness and compositional control of Ga1−xInxP growth using p-polarized reflectance

Woods, V., Dietz, N., Ito, K., & Lauko, I. (2000, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Sellmeier parameters for ZnGaP2 and GaP

Madarasz, F. L., Dimmock, J. O., Dietz, N., & Bachmann, K. J. (2000, February 1). Journal of Applied Physics.

Real-time optical control of Ga1−xInxP film growth byp-polarized reflectance

Dietz, N., Woods, V., Ito, K., & Lauko, I. (1999, July 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Representation of GaP formation by a reduced order surface kinetics model using p-polarized reflectance measurements

Beeler, S., Tran, H. T., & Dietz, N. (1999, July 1). Journal of Applied Physics, Vol. 86, pp. 674–682.

Growth of gallium phosphide layers by chemical beam epitaxy on oxide patterned (001)silicon substrates

Narayanan, V., Sukidi, N., Hu, C., Dietz, N., Bachmann, K. J., Mahajan, S., & Shingubara, S. (1998, June 1). Materials Science and Engineering B.

Optical approaches for controlling epitaxial growth

Aspnes, D. E., & Dietz, N. (1998, June 1). Applied Surface Science, Vol. 132, pp. 367–376.

Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectance

Bachmann, K. J., Sukidi, N., Höpfner, C., Harris, C., Dietz, N., Tran, H. T., … Banks, H. T. (1998, January 1). Journal of Crystal Growth, Vol. 183, pp. 323–337.

Real-time optical characterization of GaP heterostructures by p-polarized reflectance

Dietz, N., & Ito, K. (1998, February 1). Thin Solid Films.

Molecular layer epitaxy by real-time optical process monitoring

Bachmann, K. J., Höpfner, C., Sukidi, N., Miller, A. E., Harris, C., Aspnes, D. E., … Rossow, U. (1997, March 1). Applied Surface Science, Vol. 112, pp. 38–47.

Real-time monitoring of surface processes by p-polarized reflectance

Dietz, N., Sukidi, N., Harris, C., & Bachmann, K. J. (1997, May 1). Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Methods for monitoring and controlling deposition and etching using p-polarized reflectance spectroscopy

Washington, DC: U.S. Patent and Trademark Office.

Multilevel Approaches Toward Monitoring and Control of Semiconductor Epitaxy

Aspnes, D. E., Dietz, N., Rossow, U., & Bachmann, K. J. (1996, January 1). MRS Proceedings, pp. 451–462.