Works (20)

2010 journal article

Optical properties of InN grown on templates with controlled surface polarities

Physica Status Solidi. A, Applications and Materials Science, 207(10), 2351–2354.

By: R. Kirste, M. Wagner, J. Schulze, A. Strittmatter, R. Collazo, Z. Sitar, M. Alevli, N. Dietz, A. Hoffmann

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Antiphase boundaries in GaP layers grown on (001) Si by chemical beam epitaxy

Acta Materialia, 50(6), 1275–1287.

By: V. Narayanan, S. Mahajan, K. Bachmann, V. Woods & N. Dietz

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Pseudodielectric function of ZnGeP2 from 1.5 to 6 eV

Applied Physics Letters, 81(4), 628–630.

By: V. Blickle, K. Flock, N. Dietz & D. Aspnes

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Stacking faults and twins in gallium phosphide layers grown on silicon

Philosophical Magazine. A, Physics of Condensed Matter, Defects and Mechanical Properties, 82(4), 685–698.

By: V. Narayanan, S. Mahajan, K. Bachmann, V. Woods & N. Dietz

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Surface reaction kinetics of Ga1-xInxP growth during pulsed chemical beam epitaxy

Applied Surface Science, 178(1-4), 63–74.

By: N. Dietz, S. Beeler, J. Schmidt & H. Tran

Source: NC State University Libraries
Added: August 6, 2018

2001 journal article

Theoretical analysis of phase-matched second-harmonic generation and optical parametric oscillation in birefringent semiconductor waveguides

Applied Optics, 40(9), 1438–1441.

By: J. Dimmock, F. Madarasz, N. Dietz & K. Bachmann

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Orientation mediated self-assembled gallium phosphide islands grown on silicon

Philosophical Magazine. A, Physics of Condensed Matter, Defects and Mechanical Properties, 80(3), 555–572.

By: V. Narayanan, S. Mahajan, N. Sukidi, K. Bachmann, V. Woods & N. Dietz

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Real-time thickness and compositional control of Ga1-xInxP growth using p-polarized reflectance

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 18(4), 1190–1195.

By: V. Woods, N. Dietz, K. Ito & I. Lauko

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Sellmeier parameters for ZnGaP2 and GaP

Journal of Applied Physics, 87(3), 1564–1565.

By: F. Madarasz, J. Dimmock, N. Dietz & K. Bachmann

Source: NC State University Libraries
Added: August 6, 2018

2000 journal article

Sellmeier parameters for ZnGaP2 and GaP (vol 87, pg 1564, 2000)

Journal of Applied Physics, 87(10), 7597.

By: F. Madarasz, J. Dimmock, N. Dietz & K. Bachmann

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Real-time optical control of Ga1-xInxP film growth by p- polarized reflectance

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 17(4), 1300–1306.

By: N. Dietz, V. Woods, K. Ito & I. Lauko

Source: NC State University Libraries
Added: August 6, 2018

1999 journal article

Representation of gap formation by a reduced order surface kinetics model using P-polarized reflectance measurements

Journal of Applied Physics, 86(1), 674–682.

By: S. Beeler, H. Tran & N. Dietz

Source: NC State University Libraries
Added: August 6, 2018

1998 personal communication

Growth of gallium phosphide layers by chemical beam epitaxy on oxide patterned (001)silicon substrates

By: V. Narayanan, N. Sukidi, C. Hu, N. Dietz, K. Bachmann, S. Mahajan, S. Shingubara

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Optical approaches for controlling epitaxial growth

Applied Surface Science, 132(1998 June), 367–376.

By: D. Aspnes & N. Dietz

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectance

Journal of Crystal Growth, 183(3), 323–337.

Source: NC State University Libraries
Added: August 6, 2018

1998 journal article

Real-time optical characterization of GaP heterostructures by p-polarized reflectance

Thin Solid Films, 313(1998 Feb.), 614–619.

By: N. Dietz & K. Ito

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Molecular layer epitaxy by real-time optical process monitoring

Applied Surface Science, 112(1997 Mar.), 38–47.

By: K. Bachmann, C. Hopfner, N. Sukidi, A. Miller, C. Harris, D. Aspnes, N. Dietz, H. Tran ...

Source: NC State University Libraries
Added: August 6, 2018

1997 conference paper

Multilevel approaches toward monitoring and control of semiconductor epitaxy

Control of semiconductor surfaces and interfaces: Symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A. (Materials Research Society Symposium proceedings, no. 448), 451–462.

By: D. Aspnes, N. Dietz, U. Rossow & K. Bachmann

Source: NC State University Libraries
Added: August 6, 2018

1997 journal article

Real-time monitoring of surface processes by p-polarized reflectance

Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films, 15(3 pt.1), 807–815.

By: N. Dietz, N. Sukidi, C. Harris & K. Bachmann

Source: NC State University Libraries
Added: August 6, 2018

1996 patent

Methods for monitoring and controlling deposition and etching using p-polarized reflectance spectroscopy

Washington, DC: U.S. Patent and Trademark Office.

By: K. Bachmann, N. Dietz & A. Miller

Source: NC State University Libraries
Added: August 6, 2018