Works (17)

2016 journal article

Magnetoelectric oxide films for spin manipulation in graphene

Physica Status Solidi-Rapid Research Letters, 10(3), 242–247.

By: S. Stuart, B. Gray, D. Nevola, L. Su, E. Sachet, M. Ulrich, D. Dougherty

Source: NC State University Libraries
Added: August 6, 2018

2013 journal article

Smooth MgO films grown on graphite and graphene by pulsed laser deposition

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 31(5).

By: S. Stuart, E. Satchet, A. Sandin, J. Maria, J. Rowe, D. Dougherty, M. Ulrich

Source: NC State University Libraries
Added: August 6, 2018

2010 journal article

Surface reconstruction of hexagonal Y-doped HoMnO3 and LuMnO3 studied using low-energy electron diffraction

Physical Review. B, Condensed Matter and Materials Physics, 81(16).

By: R. Vasic, J. Sadowski, Y. Choi, H. Zhou, C. Wiebe, S. Cheong, J. Rowe, M. Ulrich

Source: NC State University Libraries
Added: August 6, 2018

2009 conference paper

Predeposition plasma nitridation process applied to Ge substrates to passivate interfaces between crystalline-Ge substrates and Hf-based high-K dielectrics

In Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures (Vol. 27, pp. 294–299).

By: G. Lucovsky, J. Long, K. Chung, H. Seo, B. Watts, R. Vasic, M. Ulrich

Source: NC State University Libraries
Added: August 6, 2018

2008 journal article

Bulk defects in nano-crystalline and in non-crystalline HfO2-based thin film dielectrics

Thin Solid Films, 517(1), 437–440.

By: S. Lee, H. Seo, G. Lucovsky, L. Fleming, M. Ulrich & J. Luning

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Defect reduction by suppression of pi-bonding coupling in nano- and non-crystalline high-(medium)-kappa gate dielectrics

Microelectronic Engineering, 84(9-10), 2350–2353.

By: G. Lucovsky, H. Seo, S. Lee, L. Fleming, M. Ulrich & J. Luning

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Intrinsic electronically active defects in transition metal elemental oxides

Communications & Review Papers, 46(4B), 1899–1909.

By: G. Lucovsky, H. Seo, S. Lee, L. Fleming, M. Ulrich, J. Luning, P. Lysaght, G. Bersuker

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Length scales for coherent pi-bonding interactions in complex high-k oxide dielectrics and their interfaces

Microelectronic Engineering, 84(9-10), 2298–2301.

By: H. Seo, G. Lucovsky, L. Fleming, M. Ulrich, J. Luning, G. Koster, T. Geballe

Source: NC State University Libraries
Added: August 6, 2018

2007 journal article

Spectroscopic studies of O-vacancy defects in transition metal oxides

Journal of Materials Science. Materials in Electronics., 18, S263–266.

By: G. Lucovsky, J. Luning, L. Fleming, M. Ulrich, J. Rowe, H. Seo, S. Lee, P. Lysaght, G. Bersuker

Source: NC State University Libraries
Added: August 6, 2018

2006 journal article

Intrinsic bonding defects in transition metal elemental oxides

Microelectronics Reliability, 46(9-11), 1623–1628.

By: G. Lucovsky, H. Seo, L. Fleming, M. Ulrich, J. Luning, P. Lysaght, G. Bersuker

Source: NC State University Libraries
Added: August 6, 2018

2005 journal article

Surface atom core-level shifts of clean and oxygen-covered Re(1231)

Physical Review. B, Condensed Matter and Materials Physics, 72(3).

By: A. Chan, G. Wertheim, H. Wang, M. Ulrich, J. Rowe & T. Madey

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Influence of substrate temperature on epitaxial copper phthalocyanines studied by photoemission spectroscopy

Journal of Applied Physics, 95(3), 982–988.

By: T. Ellis, K. Park, S. Hulbert, M. Ulrich & J. Rowe

Source: NC State University Libraries
Added: August 6, 2018

2004 journal article

Near-edge absorption fine structure and UV photoemission spectroscopy studies of aligned single-walled carbon nanotubes on Si(100) substrates

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 22(4), 2000–2004.

By: L. Fleming, M. Ulrich, K. Efimenko, J. Genzer, A. Chan, T. Madey, S. Oh, O. Zhou, J. Rowe

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Bonding and structure of ultrathin yttrium oxide films for Si field effect transistor gate dielectric applications

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 21(4), 1792–1797.

By: M. Ulrich, J. Rowe, D. Niu & G. Parsons

Source: NC State University Libraries
Added: August 6, 2018

2003 journal article

Soft x-ray photoelectron spectroscopy of (HfO2)(x)(SiO2)(1-x) high-k gate-dielectric structures

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 21(4), 1777–1782.

By: M. Ulrich, J. Hong, J. Rowe, G. Lucovsky, A. Chan & T. Madey

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Effect of contact resistance in solid-state thermionic refrigeration

Journal of Applied Physics, 92(1), 245–247.

By: M. Ulrich, P. Barnes & C. Vining

Source: NC State University Libraries
Added: August 6, 2018

2002 journal article

Interface electronic structure of Ta2O5-Al2O3 alloys for Si- field-effect transistor gate dielectric applications

Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures, 20(4), 1732–1738.

By: M. Ulrich, R. Johnson, J. Hong, J. Rowe, G. Lucovsky, J. Quinton, T. Madey

Source: NC State University Libraries
Added: August 6, 2018