Materials Science & Engineering

High efficiency blue phosphorescent organic light-emitting device

Applied Physics Letters, 93(14), 143307.

Low voltage and very high efficiency deep-blue phosphorescent organic light-emitting devices

Applied Physics Letters, 93(13), 133309.

Effects of triplet energies and transporting properties of carrier transporting materials on blue phosphorescent organic light emitting devices

Applied Physics Letters, 93(12), 123306.

Organic/inorganic nanocomposites for high-dielectric-constant materials

Applied Physics Letters, 93(12), 123305.

Efficient deep-blue phosphorescent organic light-emitting device with improved electron and exciton confinement

Applied Physics Letters, 92(22), 223301.

Cavity effects on light extraction in organic light emitting devices

Applied Physics Letters, 92(3), 033303.

Effects of solution-processed polymer interlayers on hole injection and device performance of polymer light-emitting diodes

Organic Electronics, 9(2), 183–190.

Carbon-Nanotube-Enabled Vertical Field Effect and Light-Emitting Transistors

Advanced Materials, 20(19), 3605–3609.

LiF as an n-Dopant in Tris(8-hydroxyquinoline) Aluminum Thin Films

Advanced Materials, 20(8), 1456–1461.

Microstructural and Interface Analysis of Ceramic Eutectic Composites

Microscopy and Microanalysis, 14(S2), 142–143.

Microstructural and Radial Distribution Function Analysis of Hydrogenated Silicon, Germanium, and Silicon-Germanium Alloy Thin Films

Microscopy and Microanalysis, 14(S2), 406–407.

TEM Characterization of Microtwins in VOx thin films

Microscopy and Microanalysis, 14(S2), 226–227.

Disordered Vanadium Oxide Thin Films for Use in Infrared Detection

Microscopy and Microanalysis, 14(S2), 236–237.

TEM Characterization of Nanometer-Scale Spinel /Rocksalt Phase Decomposition in Nickel Magnanite Thin Film

Microscopy and Microanalysis, 14(S2), 228–229.

EDX Analysis of Grain Boundary Segregation in 1 at% Nd Doped Polycrystalline YAG

Microscopy and Microanalysis, 14(S2), 1420–1421.

Anodic Tantalum Pentoxide: Chemical and Structural Characterization of a Bi-Layer Oxide

Microscopy and Microanalysis, 14(S2), 328–329.

Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM

Microscopy and Microanalysis, 14(S2), 992–993.

Atomic Investigation of Al2O3/GaN Heterostructures Interfaces using Aberration-Corrected STEM Combined with First-Principles Methods

Microscopy and Microanalysis, 14(S2), 1402–1403.

Investigation of heteroepitaxy on nanoscopically roughened (001)Si by real-time spectroscopic polarimetry

Physica Status Solidi (c), 5(5), 1312–1315.

Single-electron transistors made by chemical patterning of silicon dioxide substrates and selective deposition of gold nanoparticles

Applied Physics Letters, 93(12), 123101.