Analytical Instrumentation Facility

College of Engineering

Works Published in 2018

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Displaying all 7 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2018 journal article

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

PLOS ONE, 13(12).

By: S. Smith*, C. Zhou n, F. Stevie n & R. Garcia n

MeSH headings : Chlorides / chemistry; Insecticide-Treated Bednets; Insecticides / analysis; Microscopy, Electron, Scanning; Permethrin / analysis; Spectrometry, Mass, Secondary Ion
Sources: Web Of Science, ORCID
Added: January 14, 2019

2018 journal article

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(5).

By: J. Tuggle*, U. Pudasaini*, F. Stevie n, M. Kelley*, A. Palczewski* & C. Reece*

Source: Web Of Science
Added: October 16, 2018

2018 journal article

Determination of chemical composition in multilayer polymer film using ToF-SIMS

ANALYTICAL METHODS, 10(21), 2444–2449.

By: C. Zhou n, D. Sun*, R. Garcia n & F. Stevie n

Sources: Web Of Science, ORCID
Added: August 6, 2018

2018 journal article

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: C. Zhou n, F. Stevie n, S. Smith*, D. Rading & J. Zakel

Source: Web Of Science
Added: August 6, 2018

2018 journal article

Quantification of organic materials by ion implantation

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: C. Zhou n, F. Stevie n & S. Smith*

Source: Web Of Science
Added: August 6, 2018

2018 journal article

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: A. Klump n, C. Zhou n, F. Stevie n, R. Collazo n & Z. Sitar n

Source: Web Of Science
Added: August 6, 2018

2018 journal article

Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material

INORGANIC CHEMISTRY, 57(5), 2752–2765.

Source: Web Of Science
Added: August 6, 2018