Analytical Instrumentation Facility

Works Published in 2018

search works

Displaying all 7 works

Sorted by most recent date added to the index first, which may not be the same as publication date order.

2018 journal article

Imaging and quantitative analysis of insecticide in mosquito net fibers using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

PLOS ONE, 13(12).

MeSH headings : Chlorides / chemistry; Insecticide-Treated Bednets; Insecticides / analysis; Microscopy, Electron, Scanning; Permethrin / analysis; Spectrometry, Mass, Secondary Ion
TL;DR: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis was used to qualitatively and quantitatively assess the distribution of permethrin insecticide on the surfaces and interiors of Olyset long-lasting insecticidal net (LLIN) fibers, suggesting that these fibers fall into the class of monolithic sustained-release devices. (via Semantic Scholar)
Sources: Web Of Science, NC State University Libraries
Added: January 14, 2019

2018 journal article

Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(5).

By: J. Tuggle n, U. Pudasaini n, F. Stevie n, M. Kelley n, A. Palczewski n & C. Reece n

UN Sustainable Development Goal Categories
Source: Web Of Science
Added: October 16, 2018

2018 journal article

Determination of chemical composition in multilayer polymer film using ToF-SIMS

ANALYTICAL METHODS, 10(21), 2444–2449.

By: C. Zhou n, D. Sun*, R. Garcia n & F. Stevie n

UN Sustainable Development Goal Categories
Sources: Web Of Science, NC State University Libraries
Added: August 6, 2018

2018 journal article

ToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: C. Zhou n, F. Stevie n, S. Smith*, D. Rading & J. Zakel

UN Sustainable Development Goal Categories
Source: Web Of Science
Added: August 6, 2018

2018 journal article

Quantification of organic materials by ion implantation

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

TL;DR: In recent work, the authors demonstrated quantification of the value of ion implantation in secondary ion mass spectrometry for depth profiling of organic substrates. (via Semantic Scholar)
Source: Web Of Science
Added: August 6, 2018

2018 journal article

Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 36(3).

By: A. Klump n, C. Zhou n, F. Stevie n, R. Collazo n & Z. Sitar n

Source: Web Of Science
Added: August 6, 2018

2018 journal article

Lanthanum-Doped Hafnium Oxide: A Robust Ferroelectric Material

INORGANIC CHEMISTRY, 57(5), 2752–2765.

By: U. Schroeder*, C. Richter*, M. Park*, T. Schenk*, M. Pesic*, M. Hoffmann*, F. Fengler*, D. Pohl* ...

TL;DR: La:HfO2 appears to be a material with a broad window of process parameters, and accordingly, by optimization of the La content in the layer, it is possible to improve the performance of the material significantly. (via Semantic Scholar)
Source: Web Of Science
Added: August 6, 2018

Citation Index includes data from a number of different sources. If you have questions about the sources of data in the Citation Index or need a set of data which is free to re-distribute, please contact us.

Certain data included herein are derived from the Web of Science© and InCites© (2024) of Clarivate Analytics. All rights reserved. You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.