Displaying works 101 - 120 of 215 in total
Sorted by most recent date added to the index first, which may not be the same as publication date order.
2000 journal article
Dielectric function and bowing parameter of Zn1-xMgxSe and Zn1-xBexSe alloys
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 37(6), 1012–1016.
2000 journal article
Covariant field theory on frame bundles of fibered manifolds
JOURNAL OF MATHEMATICAL PHYSICS, 41(10), 6808–6823.
2000 journal article
Coherent optical phonon generation by the electric current in quantum wells
APPLIED PHYSICS LETTERS, 77(25), 4178–4180.
2000 article
Charge redistribution at GaN-Ga2O3 interfaces: a microscopic mechanism for low defect density interfaces in remote-plasma-processed MOS devices prepared on polar GaN faces
Therrien, R., Lucovsky, G., & Davis, R. (2000, October 9). APPLIED SURFACE SCIENCE, Vol. 166, pp. 513–519.
2000 journal article
A broadband X-ray study of supernova remnant 3C 397
ASTROPHYSICAL JOURNAL, 545(2), 922–938.
2000 article
Time-temperature superposition of phase separating polymer blend films
Winesett, D. A., Zhu, S., Sokolov, J., Rafailovich, M., & Ade, H. (2000, December). HIGH PERFORMANCE POLYMERS, Vol. 12, pp. 599–602.
2000 journal article
Structure of complex atom and photoionization of lithium below Li+ 1s3s S-3 - art. no. 030701
Physical Review. A, 6103(3), 0701.
2000 journal article
Scanning tunneling microscope measurements of the amplitude of vibration of a quartz crystal oscillator
JOURNAL OF APPLIED PHYSICS, 88(7), 4017–4021.
Contributors: B. Borovsky n, B. Mason n & J. Krim n
2000 article
Plasma processed ultra-thin SiO2 interfaces far advanced silicon NMOS and PMOS devices: applications to Si-oxide Si oxynitride, Si-oxide Si nitride and Si-oxide transition metal oxide stacked gate dielectrics
Lucovsky, G., Yang, H. Y., Wu, Y., & Niimi, H. (2000, October 17). THIN SOLID FILMS, Vol. 374, pp. 217–227.
2000 journal article
Orientation mediated self-assembled gallium phosphide islands grown on silicon
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 80(3), 555–572.
2000 article
Limitations for aggressively scaled CMOS Si devices due to bond coordination constraints and reduced band offset energies at Si-high-k dielectric interfaces
Lucovsky, G., & Phillips, J. C. (2000, October 9). APPLIED SURFACE SCIENCE, Vol. 166, pp. 497–503.
2000 journal article
Levitating beachballs
AMERICAN JOURNAL OF PHYSICS, 68(4), 388–389.
2000 journal article
Internal loop/bulge and hairpin loop of the iron-responsive element of ferritin mRNA contribute to maximal iron regulatory protein 2 binding and translational regulation in the iso-iron-responsive element/iso-iron regulatory protein family
BIOCHEMISTRY, 39(20), 6235–6242.
2000 patent
Integrated heterostructures of group III-V nitride semiconductor materials including epitaxial ohmic contact comprising multiple quantum well
Washington, DC: U.S. Patent and Trademark Office.
2000 article
Independent interface and bulk film contributions to reduction of tunneling currents in stacked oxide/nitride gate dielectrics with monolayer nitrided interfaces
Lucovsky, G., Niimi, H., Wu, Y., & Yang, H. (2000, June). APPLIED SURFACE SCIENCE, Vol. 159, pp. 50–61.
2000 article
In situ monitoring of MOVPE growth by combined spectroscopic ellipsometry and reflectance-difference spectroscopy
Ebert, M., Bell, K. A., Yoo, S. D., Flock, K., & Aspnes, D. E. (2000, March 27). THIN SOLID FILMS, Vol. 364, pp. 22–27.
2000 journal article
Formation of nano-crystalline Si by thermal annealing of SiOx, SiCx and SiOyCx amorphous alloys: model systems for advanced device processing
Journal of Non-Crystalline Solids, 266(2000 May), 1009–1014.
2000 journal article
Charge and mass transfer in ice-ice collisions: Experimental observations of a mechanism in thunderstorm electrification
JOURNAL OF GEOPHYSICAL RESEARCH-ATMOSPHERES, 105(D8), 10185–10192.
2000 article
Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si-SiO(2) interfaces
Niimi, H., Yang, H. Y., Lucovsky, G., Keister, J. W., & Rowe, J. E. (2000, October 9). APPLIED SURFACE SCIENCE, Vol. 166, pp. 485–491.
2000 journal article
Application of constraint theory to Si-dielectric interfaces in a-Si: H and poly-Si thin film transistors (TFTs)
Journal of Non-Crystalline Solids, 266(2000 May), 1335–1339.
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