Displaying works 141 - 160 of 215 in total
Sorted by most recent date added to the index first, which may not be the same as publication date order.
2000 journal article
Cerenkov generation of high-frequency confined acoustic phonons in quantum wells
APPLIED PHYSICS LETTERS, 76(14), 1869–1871.
2000 journal article
Ab initio phonon dispersions of wurtzite AlN, GaN, and InN
PHYSICAL REVIEW B, 61(10), 6720–6725.
2000 journal article
Towards grid-based O(N) density-functional theory methods: Optimized nonorthogonal orbitals and multigrid acceleration
PHYSICAL REVIEW B, 62(3), 1713–1722.
2000 journal article
Mechanical properties, defects and electronic behavior of carbon nanotubes
CARBON, 38(11-12), 1703–1711.
2000 article
Measurement of field emission from nitrogen-doped diamond films
DIAMOND AND RELATED MATERIALS, Vol. 9, pp. 1569–1573.
2000 journal article
Large-scale applications of real-space multigrid methods to surfaces, nanotubes, and quantum transport
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 217(1), 685–701.
2000 journal article
Inverse bremsstrahlung in shocked astrophysical plasmas
ASTROPHYSICAL JOURNAL, 528(2), 776–788.
2000 journal article
Illumination for coherent soft X-ray applications: the new X1A beamline at the NSLS
JOURNAL OF SYNCHROTRON RADIATION, 7(2000 Nov.), 395–404.
2000 journal article
Identification and characterization of the iron regulatory element in the ferritin gene of a plant (soybean)
JOURNAL OF BIOLOGICAL CHEMISTRY, 275(23), 17488–17493.
2000 journal article
Atomistic theory of mechanical relaxation in fullerene nanotubes
CARBON, 38(11-12), 1675–1680.
2000 journal article
Advancing the science and technology of diamond, diamond-like carbon, silicon carbides and Group 3 nitride materials
Diamond and Related Materials, 9(1), vii.
2000 journal article
Time-dependent dielectric wearout technique with temperature effect for reliability test of ultrathin (< 2.0 nm) single layer and dual layer gate oxides
Time-dependent dielectric wearout technique with temperature effect for reliability test of ultrathin (< 2.0 nm) single layer and dual layer gate oxides. MICROELECTRONICS RELIABILITY, 40(12), 1987–1995.
2000 journal article
Thermal X-ray emission and cosmic-ray production in young supernova remnants
ASTROPHYSICAL JOURNAL, 543(1), L57–L60.
2000 journal article
Surface segregation and interface stability of AlN/GaN, GaN/InN, and AlN/InN {0001} epitaxial systems
PHYSICAL REVIEW B, 61(16), 10820–10826.
2000 journal article
States in Mo-92 observed with the (n,n ' gamma) reaction with spallation neutrons - art. no. 014307
Physical Review. C, Nuclear Physics, 6201(1), 4307.
2000 article
Separate and independent reductions in direct tunneling in oxide/nitride stacks with monolayer interface nitridation associated with the (i) interface nitridation and (ii) increased physical thickness
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1163–1168.
2000 article
Sellmeier parameters for ZnGaP2 and GaP (vol 87, pg 1564, 2000)
Madarasz, F. L., Dimmock, J. O., Dietz, N., & Bachmann, K. J. (2000, May 15). JOURNAL OF APPLIED PHYSICS, Vol. 87, pp. 7597–7597.
2000 journal article
Schild's ladder parallel transport procedure for an arbitrary connection
International Journal of Theoretical Physics, 39(12), 2891–2898.
2000 article
Real-time thickness and compositional control of Ga1-xInxP growth using p-polarized reflectance
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 18, pp. 1190–1195.
2000 article
Real-time optical characterization of heteroepitaxy by organometallic chemical vapor deposition
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18, pp. 1184–1189.
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