Displaying all 5 works
Sorted by most recent date added to the index first, which may not be the same as publication date order.
2005 chapter
Thermal stability studies of advanced gate stack structures on Si (100)
In Characterization and Metrology for ULSI Technology 2005 (Vol. 788, pp. 156–160). http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000233588000023&KeyUID=WOS:000233588000023
Contributors: P. Sivasubramani, P. Zhao, M. Kim, B. Gnade, R. Wallace, L. Edge, D. Schlom, G. Parsons
2005 journal article
Designing interface composition and structure in high dielectric constant gate stacks
High Dielectric Constant Materials, 16, 287–310. http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=CCC&KeyUT=CCC:000227551500010&KeyUID=CCC:000227551500010
Contributors: G. Parsons , H. Huff & D. Gilmer
2005 journal article
In-situ infrared spectroscopy and density functional theory modeling of hafnium alkylamine adsorption on Si-OH and Si-H surfaces
CHEMISTRY OF MATERIALS, 17(21), 5305–5314.
Contributors: M. Kelly n, J. Han n, C. Musgrave n & G. Parsons n
2005 journal article
Microcontact patterning of ruthenium gate electrodes by selective area atomic layer deposition
APPLIED PHYSICS LETTERS, 86(5).
Contributors: K. Park n, J. Doub n, T. Gougousi n & G. Parsons n
2005 journal article
Metal oxide thin films deposited from metal organic precursors in supercritical CO2 solutions
CHEMISTRY OF MATERIALS, 17(20), 5093–5100.
Contributors: T. Gougousi n, D. Barua n, E. Young n & G. Parsons n
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